Mikrokapcsolók élettartamának vizsgálata
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Abstract
The accelerated lifetime testing method is used for the investigation of the failure analysis of the micro switches. During the examination, the determination of the parameters of the Weibull distribution is carried out and the effect of the failure methods is analysed for the lifetime of the micro switches.
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Sipkás, Vivien, and Gabriella Vadászné Bognár. 2017. “Mikrokapcsolók élettartamának vizsgálata”. Jelenkori Társadalmi és Gazdasági Folyamatok 12 (4):95-102. https://doi.org/10.14232/jtgf.2017.4.95-102.
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